Department of Electronic and Electrical Engineering / Sigmedia Group
Supervisor: Prof. Anil Kokaram
Microscopy Image Processing
The Sigmedia Group was started in 1998 when Professor Anil Kokaram joined the Department of Electronic and Electrical Engineering in Trinity College Dublin. We are involved in a very wide range of research activities centred on digital signal processing technology. Digital signal processing is concerned with the representation of signals by a sequence of numbers or symbols and the processing of these signals.
The goal of DSP is to measure, filter or compress continuous real-world analogue signals. There are three main areas of our group work:
• Digital cinema
• Multimedia information retrieval
• Video over wireless
My research is focused on the area of digital cinema, using digital signal processing to solve problems in images and videos, for example, filtering or restoring images to get rid of ‘noise’ and unwanted features. The Sigmedia Group has developed a number of techniques to further improve the quality of images and videos. In my research, I will try to extend the range of applications for these techniques, from real-world footage to nanoscale images.
As part of my research, I have worked collaboratively with the Nanoscale Functions Group in the Conway Institute in UCD. This is a multi-disciplinary team involved in a number of research areas in the field of nanoscience. Combining expertise in a number of key scientific areas, they are concerned with the design of novel biomedical applications and the understanding of the function and structure of interactions at the nanometer scale. The Nanoscale Functions Group’s research is mainly focused on the application of novel nanoforce microscopy instrumentation imaging techniques to solutions for biomedical problems at both the cellular and molecular scale. The principle measurement tool used by the group is the atomic force microscope which the use to study various biologically relevant systems at the nanoscale.
We have found that there are three main problems to be overcome in atomic force microscopy imaging:
• Reducing the ‘noise’ (interference) caused during scanning
• Finding out the intensity difference and displacement between two corresponding features within the image
• Applying the algorithms we have already developed for real-world footage to nanoscale images
It is my hope that my research will go some way to providing a solution to these problems.